Automated test equipment (ATE)

As semiconductor devices advance, test equipment requires greater stability, accuracy, and reliability. Manufacturers also need flexible, scalable, long-life components that support high throughput and compact test board designs. OMRON delivers versatile solutions, including G3VM MOSFET relays, signal and high-frequency relays, plus new EFC blade pins for IC testing. These components address challenges in high-frequency, high-power, and high-temperature conditions.