Next-level components for your ATE

Our portfolio includes products that improve reliability and accuracy across every part of your automated testing equipment — from testers and handlers to probers — with components designed for use in all types of resource cards, interface cards, and probe cards.

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Canopy

Automated Test Equipment

Product

Off

Labels

1

INSTRUMENT: TEST SIGNAL SWITCHING
2

DEVICE POWER SUPPLY CONNECTION
3

TEST HEAD
4

INTERFACE BOARD/PROBE CARD: TEST SIGNAL SWITCHING
5

CONTROL PANEL
6

HANDLING MECHANISM
7

TEST SOCKET / DUT

INSTRUMENT: TEST SIGNAL SWITCHING

MOSFET relay
G3VM series
– Low CxR type
– High speed response type
– High temperature compatible type
– Ultra-compact type
– High load voltage type (including SiC types – coming soon)

Signal relay
G6K
P6K (socket) for G6Krelay (coming soon)
G6J-Y

High frequency relay (up to 8GHz)
G6K-RF (up to 3GHz)
G6K-RF-V (up to 8GHz)
DEVICE POWER SUPPLY CONNECTION

MIL connectors
XG2/4/5

I/O connector

XW4MN

Power relays
G2RL
G6B
G7EB-E2
G9KA-E
TEST HEAD

Connection from Testing instrument to DUT by executing measurement
INTERFACE BOARD/PROBE CARD: TEST SIGNAL SWITCHING

MOSFET relay
G3VM series
– Low CxR type
– High speed response type
– High temperature compatible type
– Ultra-compact type
– High load voltage type (including SiC types – coming soon)

Signal relay
G6K
P6K (socket) for G6Krelay (coming soon)
G6J-Y

High frequency relay (up to 8GHz)
G6K-RF (up to 3GHz)
G6K-RF-V (up to 8GHz)
CONTROL PANEL

Settings

Tactile switches
B3SL/B3W/B3FS/B3FS key top
HANDLING MECHANISM

Mechanism positioning

Miniature basic switches
D3V/SS/D2

Photomicrosensor
EE-SX / EE-SY

Light convergent reflective sensor
B5W-LB
TEST SOCKET / DUT

Connecting board to DUT

EFC test pins/socket
XP2A/XP2B/ XP2S series

IC Connector to interface
XR2